With the rapid evolution of UAV technology, intelligent power equipment inspection via aerial imagery is critical. To address traditional insulator defect detection bottlenecks (high false/missed ...

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...

The process of printing defect detection usually suffers from challenges such as inaccurate defect extraction and localization, caused by uneven illumination and complex textures. Moreover, image ...